Welcome to AC3E-IHP_ALDO documentation!

Note

This project is the result of a collaboration between the Advanced Center for Electrical and Electronic Engeneering (AC3E) and the Leibniz Institute for High Performance Microelectronics (IHP), intended to be a template for futures work related to IHP-OpenPDK technology tapeouts. For more information about the PDK please refer to the official repository.

Introduction

This project includes design examples for IHP-Open-PDK technology, featuring various components like low dropout regulators, pass transistors, and amplifiers. Notably, this design was taped out as part of one of the first open-source tapeouts from IHP.

_images/LDO_AC3E_nofill.png

TOP Layout

Note

For information about the TOP layout distribution of the designs please refer to TOP Design.

This project includes:

  1. Low Dropout Regulator (LDO) in both closed and open loop configurations.

  2. The LDO Pass Transistor.

  3. Two-Stage Transconductance Amplifier.

  4. Transmission Gates for testing.

Below is a brief description of the main components of this project:

Low Dropout Regulator (LDO)

The LDO is the primary design in this project, created to provide a stable output voltage of 1.2V at 100mA (LDO Design). This design is completely characterized through corners and Monte Carlo simulations in the LDO Simulation section. Also, its main parameters are verified using the CACE tool.

The LDO is separated into Closed-Loop and Open-Loop configurations, each with its own layout in the TOP.

Two-Stage Transconductance Amplifier

The 2-Stage Operational Transconductance Amplifier (OTA Design) is a submodule of the LDO, included as a separate design for measurement purposes. The simulations of the main parameter are in the :ref:``.

Pass Transistor

The Pass Transistor is a submodule of the LDO, included as a separate design for measurement purposes. The simulations and parameter verification of the pass transistor as a standalone component are currently a work in progress.

Transmission Gates

work in progress.

Contents

Chip Testing